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苏飞 ( 副教授 ) 赞
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[11] , Fei Su*, Tianya Bian, Jun Kang, Zhidong Guan,Junwu Mu.Error analysis of phase shifting by varying the incident angle of parallel beams in shadow Moiré. Optik, Vol.24(24), Pages 6769–6771, 2013.
[12] , et al, Xiong J, Mao R,Su F.On thermo-mechanical reliability of plated-through-hole (PTH). Microelectronics Reliability, Vol. 52(6): 1189-1196, 2012.
[13] , et al, Wang X, Mao R,Su F.Creep behaviour of Sn–3.8 Ag–0.7 Cu under the effect of electromigration: Experiments and modeling. Microelectronics Reliability, Vol.51(5): 1020-1024, 2011.
[14] ,Su Fei.Evaluation of residual stress in flip chip using 3-D optical Interferometry/FEM hybrid technique. Strain, Vol.43(4): 289-298, 2007.
[15] , Yi S, Chian K S,Fei Su.An optical technique to characterize hygroscopic expansion and its effects on plastic Packages. Microelectronics Reliability, Vol. 46: 600-609, 2006.
[16] , Liu Yu Chan, Wei Jun,Su Fei.Removal of AFM moiré Measurement Error due to Non-linear Scan and Creep of Probe. Journal of Nanotechnology, Vol.16 (9), pp 1681-1686 . 2005.
[17] , Dai Fulong, Cherm Sin Chian,Su Fei.Development and instrumentation of an integrated three–dimensional optical testing system for application in integrated circuit packaging. Review of Scientific Instrument. Vol.76 (9), 2005.
[18] ,Su Fei.Development of an integrated optical system for warpage and hermeticity test of microdisplay. Optics and Lasers in Engineering, Vol.74(11), Pages 87–93, 2005.
[19] ,Yi Sung, Chian Kerm Sin, Dai Fulong,Su Fei.Simultaneous Recording of Fringe Patterns with one Camera. Journal of Acta Mechnica Sinica, Vol. 20(6) pp.613-622, 2004
[20] ,Yi Sung, Chian Kerm Sin, Sun Yaofeng,Su Fei.Use of Wollaston Prism to Simplify the Polarization Method for Simultaneous Recording of Moiré Interferometry Fringe Patterns. Optical Engineering, Vol.43 (12), pp.3003-3007, 2004.

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