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同专业博导
同专业硕导
屈玉福
( 教授 )
赞
的个人主页 http://shi.buaa.edu.cn/cpl/zh_CN/index.htm
教授 博士生导师 硕士生导师
主要任职:
测控与信息技术系党支部书记
教师英文名称:
Yufu Qu
教师拼音名称:
Qu Yufu
电子邮箱:
218e2f9b8de7f94e11b14b8714ee06e4f4319e4cad113000e35b1075ca3f645e519d96864f23ae9e777d84f9d3eb5c327aa0ca958ff0b8ee06e5b9a555ebb5220c09a081e5d982448723d683e5e86eb0de101c4cc84f45d8a8b9cc40a1687723e7e7e6dd2f67cc3fd739a5132ee465a2a9f940326db67a331eb1f72cdee1cd2a
所在单位:
仪器科学与光电工程学院
学历:
博士研究生
办公地点:
新主楼B座711
性别:
男
学位:
博士
在职信息:
在职
毕业院校:
哈尔滨工业大学
论文
当前位置:
计算成像技术实验室
>>
论文
[1]
.Renju Peng, Jie Jiang, Jialin Hao, Yufu Qu. Lateral movement and angular illuminating non-uniformity corrected TSOM image using Fourier transform. Optics Express. 2020, 28(5): 6294-6305
[2]
.Yufu Qu, Jialin Hao, Renju Peng. Machine-learning models for analyzing TSOM images of nanostructures. Optics Express. 2019, 27(23):33978-33998
[3]
.潘晖,屈玉福,非平行光干涉照明显微镜三维形貌检测研究. 应用光学. 2019,40(3):75~81
[4]
.Yufu Qu, Hui Pan, Renju Peng, Jiebin Niu, Chenggui Li. Interference illumination of three nonzero-order beams for LCOS-based structured illumination microscopy. Journal of microscopy. 2019, 275(2):97~106
[5]
.Renju Peng, Yufu Qu, Jialin Hao, Hui Pan, Jiebin Niu, Jie Jiang. Multiple Parametric Nanoscale Measurements with High Sensitivity Based on Through-focus Scanning Optical Microscopy. Journal of microscopy. 2019, 274(3):139~149
[6]
.Yufu Qu, Xuan Zhang, Qianyi Wang, Chenggui Li. Extremely Sparse Stripe Noise Removal from Nonremote-Sensing Images by Straight Line Detection and Neighborhood Grayscale Weighted Replacement. IEEE Access. 2018, 6:76924-76934
[7]
.Yufu Qu, Renju Peng, Jialin Hao, Hui Pan, Jiebin Niu, Jie Jiang. Influence of Illumination Polarization and Target Structure on Measurement Sensitivity of Through-Focus Scanning Optical Microscopy. Applied Sciences. 2018, 8(10), 1819~1831
[8]
.Yufu Qu, Yongbo Hu, Ping Zhang. Nonmechanical and multiview 3D measurement microscope for workpiece with large slope and complex geometry. Journal of microscopy. 2018, 272(2):123~135
[9]
.Yufu Qu, Ping Zhang, Yongbo Hu. 3D measurements of micro-objects based on monocular wide-field optical microscopy with extended depth of field. Microscopy Research and Technique. 2018, 81(12):1434~1442
[10]
.Yufu Qu, Yongbo Hu. Analysis of axial scanning range and magnification variation in widefield microscope for measurement using an electrically tunable lens. Microscopy Research and Technique. 2019, 82(2):101~113
共39条 1/4
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