北京航空航天大学主页平台系统屈玉福--计算成像技术实验室-- Renju Peng, Yufu Qu, Jialin Hao, Hui Pan, Jiebin Niu, Jie Jiang. Multiple Parametric Nanoscale Measurements with High Sensitivity Based on Through-focus Scanning Optical Microscopy. Journal of microscopy. 2019, 274(3):139~149

扫描手机二维码

欢迎您的访问
您是第位访客

开通时间：..

最后更新时间：..

同专业博导

同专业硕导

屈玉福 ( 教授 ) 赞
的个人主页 http://shi.buaa.edu.cn/cpl/zh_CN/index.htm
教授博士生导师硕士生导师
主要任职：测控与信息技术系党支部书记

论文当前位置：计算成像技术实验室 >> 论文

Renju Peng, Yufu Qu, Jialin Hao, Hui Pan, Jiebin Niu, Jie Jiang. Multiple Parametric Nanoscale Measurements with High Sensitivity Based on Through-focus Scanning Optical Microscopy. Journal of microscopy. 2019, 274(3):139~149

点击次数：
是否译文：否

上一条： Yufu Qu, Hui Pan, Renju Peng, Jiebin Niu, Chenggui Li. Interference illumination of three nonzero-order beams for LCOS-based structured illumination microscopy. Journal of microscopy. 2019, 275(2):97~106

下一条： Yufu Qu, Xuan Zhang, Qianyi Wang, Chenggui Li. Extremely Sparse Stripe Noise Removal from Nonremote-Sensing Images by Straight Line Detection and Neighborhood Grayscale Weighted Replacement. IEEE Access. 2018, 6:76924-76934