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上一条: Yufu Qu, Renju Peng, Jialin Hao, Hui Pan, Jiebin Niu, Jie Jiang. Influence of Illumination Polarization and Target Structure on Measurement Sensitivity of Through-Focus Scanning Optical Microscopy. Applied Sciences. 2018, 8(10), 1819~1831
下一条: Yufu Qu, Ping Zhang, Yongbo Hu. 3D measurements of micro-objects based on monocular wide-field optical microscopy with extended depth of field. Microscopy Research and Technique. 2018, 81(12):1434~1442