北京航空航天大学主页平台系统屈玉福--计算成像技术实验室-- Yufu Qu, Renju Peng, Jialin Hao, Hui Pan, Jiebin Niu, Jie Jiang. Influence of Illumination Polarization and Target Structure on Measurement Sensitivity of Through-Focus Scanning Optical Microscopy. Applied Sciences. 2018, 8(10), 1819~1831

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Yufu Qu, Renju Peng, Jialin Hao, Hui Pan, Jiebin Niu, Jie Jiang. Influence of Illumination Polarization and Target Structure on Measurement Sensitivity of Through-Focus Scanning Optical Microscopy. Applied Sciences. 2018, 8(10), 1819~1831

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上一条： Yufu Qu, Xuan Zhang, Qianyi Wang, Chenggui Li. Extremely Sparse Stripe Noise Removal from Nonremote-Sensing Images by Straight Line Detection and Neighborhood Grayscale Weighted Replacement. IEEE Access. 2018, 6:76924-76934

下一条： Yufu Qu, Yongbo Hu, Ping Zhang. Nonmechanical and multiview 3D measurement microscope for workpiece with large slope and complex geometry. Journal of microscopy. 2018, 272(2):123~135