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上一条: Renju Peng, Yufu Qu, Jialin Hao, Hui Pan, Jiebin Niu, Jie Jiang. Multiple Parametric Nanoscale Measurements with High Sensitivity Based on Through-focus Scanning Optical Microscopy. Journal of microscopy. 2019, 274(3):139~149
下一条: Yufu Qu, Renju Peng, Jialin Hao, Hui Pan, Jiebin Niu, Jie Jiang. Influence of Illumination Polarization and Target Structure on Measurement Sensitivity of Through-Focus Scanning Optical Microscopy. Applied Sciences. 2018, 8(10), 1819~1831