Yujie Ren , Bin Liu , and Shihai Wang(第一通信作者),Joint Instance and Feature Adaptation for Heterogeneous Defect Prediction,IEEE TRANSACTIONS ON RELIABILITY
- DOI码:10.1109/TR.2023.3305356
- 发表刊物:IEEE TRANSACTIONS ON RELIABILITY
- 刊物所在地:美国
- 关键字:Domain adaptation (DA), feature adaptation,
heterogeneous defect prediction (HDP), instance adaptation,
software defect prediction (SDP)
- 合写作者:Bin Liu
- 第一作者:Yujie Ren
- 论文类型:期刊论文
- 通讯作者:Shihai Wang
- 一级学科:软件工程
- 文献类型:期刊
- 是否译文:否
- 发表时间:2023-10-06
- 收录刊物:SCI
- 发布期刊链接:https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10273729