上一条:Yujie Ren , Bin Liu , and Shihai Wang(第一通信作者),Joint Instance and Feature Adaptation for Heterogeneous Defect Prediction,IEEE TRANSACTIONS ON RELIABILITY
下一条:Tong Haonan; Liu Bin; Wang Shihai(第一通讯作者), Kernel Spectral Embedding Transfer Ensemble for Heterogeneous Defect Prediction, IEEE Transactions on Software Engineering.