上一条:Xiao Peng; Liu Bin; Wang Shihai(第一通讯作者), Feedback-based integrated prediction: Defect prediction based on feedback from software testing process, Journal of Systems and Software.
下一条:Tong Haonan; Liu Bin; Wang Shihai(第一通讯作者), Software defect prediction using stacked denoising autoencoders and two-stage ensemble learning, Information and Software Technology.