上一条:Shao Yuanxun; Liu Bin; Wang Shihai(第一通讯作者); Li Guoqi, A novel software defect prediction based on atomic class-association rule mining, Expert Systems with Applications.
下一条:Yan Xiaobo; Bin Liu; Wang Shihai(第一通讯作者), A Test Restoration Method based on Genetic Algorithm for effective fault localization in multiple-fault programs, Journal of Systems and Software.