的个人主页 http://shi.buaa.edu.cn/sufei/zh_CN/index.htm
上一条: Use of Wollaston Prism to Simplify the Polarization Method for Simultaneous Recording of Moiré Interferometry Fringe Patterns. Optical Engineering, Vol.43 (12), pp.3003-3007, 2004.
下一条: Influence of stress on the electromigration life of solder. IEEE Transactions on Components, Packaging and Manufacturing Technology, 7(5), 762-767.