上一条:Xiong J, Shenoi RA*, Gao Z. Small sample theory for reliability design. J STRAIN ANAL ENG, 2002; 37(1): 87-92
下一条:Xiong JJ*, Gao ZT, Liu Xb, Sun XF. On stochastic bifurcation behaviour of atom movement at the tip of crack in fatigue damage system. ACTA PHYS SIN-CH ED, 2000; 49(1): 49-53