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Paper

You Wang, Hao Cai, Lirida Naviner, Xiaoxuan Zhao, Yue Zhang, Erya Deng, Jacques-Olivier Klein, Weisheng Zhao, “A process-variation-resilient methodology of circuit design by using asymmetrical forward body bias in 28nm FDSOI”, Microelectronics Reliability, vol.64, pp.26-30, 2016.

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