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上一条: Fuqiang Sun; Hongxuan Guo; Jingcheng Liu. Reliability Modeling of the bivariate deteriorating Product with both Monotonic and Non-Monotonic Degradation Paths [J]. Journal of Systems Engineering and Electronics, 2021, 32(4): 971-983.
下一条: 孙富强, 李艳宏, 程圆圆. 考虑冲击韧性的退化-冲击相依竞争失效建模 [J]. 北京航空航天大学学报, 2020, 46(12): 2195-2202