北京航空航天大学主页平台系统孙富强--中文主页-- Fuqiang Sun; Hongxuan Guo; Jingcheng Liu. Reliability Modeling of the bivariate deteriorating Product with both Monotonic and Non-Monotonic Degradation Paths [J]. Journal of Systems Engineering and Electronics, 2021, 32(4): 971-983.

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Fuqiang Sun; Hongxuan Guo; Jingcheng Liu. Reliability Modeling of the bivariate deteriorating Product with both Monotonic and Non-Monotonic Degradation Paths [J]. Journal of Systems Engineering and Electronics, 2021, 32(4): 971-983.

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上一条： Fuqiang Sun, Hongxuan Guo, Ning Wang, Wei Zhang. Remaining useful life prediction for bivariate deteriorating systems under dynamic operational conditions[J]. Quality and Reliability Engineering International, 2022, https://doi.org/10.1002/qre.3023.

下一条： Sun Fuqiang, Liu Le, Li Xiaoyang, Liao Haitao*. Stochastic Modeling and Analysis of Multiple Nonlinear Accelerated Degradation Processes through Information Fusion [J]. Sensors, 2016, 16(8): 1242.