Presented papers:

1. Chunling Zhu, Yihai He, Jiaming Cui, Fengdi Liu. Assessing the risk of product infant failure based on Bayesian network and manufacturing quality variation propagation.

2. Yi Wei, Yihai He, Chunling Zhu, Zhaoxiang Chen. A warranty period optimization strategy considering the change point of infant failure rate.

3. ChangchaoGu, Yihai He, Xiao Han, Zhaoxiang Chen. Product quality oriented predictive maintenance strategy for manufacturing systems.

4. Xiao Han, Yihai He, Zhaoxiang Chen. An Integrated Multi-objective Production Scheduling Model Considering the Production Quality State.

Date: July9-12, 2017

Venue:Sun Island Garden Hotel, Binghua Avenue, Songbei District, Harbin, China.

About PHM 2017

This IEEE PHM Harbin Conference is the 8th IEEE PHM conference and the largest so far with over 400 attendees. Papers in this conference discuss methods used for anomaly detection, diagnostics and prognostics, including the monitoring and reasoning of parameters that are precursors to impending “failure”, such as anomaly telemetry data detection in condition monitoring data; and the modelling of contact damage utilizing vibration stress analysis. Other papers discuss how the deep learning can enable products to monitor and report on their own condition and environment, helping to generate previously unavailable insights into their own condition assessment and utilization for users. Other papers discuss how complex product operations can be controlled by the users, through numerous remote-access options in order to give users the unprecedented ability to customize the function, performance, and interface of products and to operate them in hazardous or hard-to-reach environments. And finally, there are papers that discuss how the combination of condition monitoring data, remote control, and optimization algorithms allows products autonomy, so that products can learn, adapt to the environment change and to user preferences, service themselves, and operate on their own.

Photos

From left to right: Xiao Han,Chunling Zhu,Yi Wei,Changchao Gu.