北京航空航天大学主页平台系统郑征--北航郑征主页-- Zhang, L., Yan, L., Zhang, Z., Zhang, J., Chan, W. K., & Zheng, Z. (2017). A theoretical analysis on cloning the failed test cases to improve spectrum-based fault localization. Journal of Systems and Software, 129, 35-57.

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郑征

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教授博士生导师硕士生导师

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所在单位：自动化科学与电气工程学院

学历：博士研究生

在职信息：在职

主要任职：副院长

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Zhang, L., Yan, L., Zhang, Z., Zhang, J., Chan, W. K., & Zheng, Z. (2017). A theoretical analysis on cloning the failed test cases to improve spectrum-based fault localization. Journal of Systems and Software, 129, 35-57.

发布时间：2018-09-29 点击次数：

是否译文：否

上一条：Xiao, G., Zheng, Z.*, Yin, B., Trivedi, K. S., Du, X., & Cai, K. (2017). Experience Report: Fault Triggers in Linux Operating System: From Evolution Perspective. In Software Reliability Engineering (ISSRE), 2017 IEEE 28th International Symposium on.

下一条：Zhang, X. Y., Zheng, Z.*, & Cai, K. Y. (2018). A Fortification Model for Decentralized Supply Systems and Its Solution Algorithms. IEEE Transactions on Reliability, 67(1), 381-400.