北京航空航天大学主页平台系统郑征--北航郑征主页-- Qiu, K., Zheng, Z., Trivedi, K. S., & Yin, B. (2019). Stress testing with influencing factors to accelerate data race software failures. IEEE Transactions on Reliability. Accepted.

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个人信息

郑征

教授

教授博士生导师硕士生导师

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所在单位：自动化科学与电气工程学院

学历：博士研究生

在职信息：在职

主要任职：副院长

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论文

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Qiu, K., Zheng, Z., Trivedi, K. S., & Yin, B. (2019). Stress testing with influencing factors to accelerate data race software failures. IEEE Transactions on Reliability. Accepted.

发布时间：2020-01-26 点击次数：

是否译文：否

上一条：Xu, Y., Yin, B., Zheng, Z., Zhang, X., Li, C., & Yang, S. (2019). Robustness of spectrum-based fault localisation in environments with labelling perturbations. Journal of Systems and Software, 147, 172-214.

下一条：Xiao, G., Zheng, Z., Jiang, B., & Sui, Y. (2019). An empirical study of regression bug chains in Linux. IEEE Transactions on Reliability. Accepted.