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(1)Lu Fu, Zaowen Yan, Changshun Fu, and Donglin Su, Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits, IEEE Access, Vol.9, November 9, 2021, pp: 149125-149136 (SCI(ISI): WOS:000716688700001)

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Next One:(2)Jianwei Wang, Zhaowen Yan, Changshun Fu, Zhangqiang Ma, Jiawei Liu, Near-Field Precision Measurement System of High-Density Integrated Module, IEEE Transactions on Instrumentation and Measurement, Vol.70, No.9, September 2021, pp: 1-9 (SCI(ISI): WOS:000715343300013)

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Paper

(1)Lu Fu, Zaowen Yan, Changshun Fu, and Donglin Su, Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits, IEEE Access, Vol.9, November 9, 2021, pp: 149125-149136 (SCI(ISI): WOS:000716688700001)