北京航空航天大学主页平台系统孙富强--中文主页-- Fuqiang Sun; Hongxuan Guo; Jingcheng Liu. Reliability Modeling of the bivariate deteriorating Product with both Monotonic and Non-Monotonic Degradation Paths [J]. Journal of Systems Engineering and Electronics, 2021, 32(4): 971-983.

已经得到个称赞给我点赞

副教授
教师拼音名称：Sun Fuqiang
电子邮箱：
入职时间：2012-12-01
所在单位：可靠性与系统工程学院
办公地点：为民楼330
联系方式：010-82338603
在职信息：在职

代表性论著

当前位置: 中文主页 >> 代表性论著

Fuqiang Sun; Hongxuan Guo; Jingcheng Liu. Reliability Modeling of the bivariate deteriorating Product with both Monotonic and Non-Monotonic Degradation Paths [J]. Journal of Systems Engineering and Electronics, 2021, 32(4): 971-983.

是否译文：否

上一条：Fuqiang Sun, Hongxuan Guo, Ning Wang, Wei Zhang. Remaining useful life prediction for bivariate deteriorating systems under dynamic operational conditions[J]. Quality and Reliability Engineering International, 2022, https://doi.org/10.1002/qre.3023.

下一条：Sun Fuqiang, Liu Le, Li Xiaoyang, Liao Haitao*. Stochastic Modeling and Analysis of Multiple Nonlinear Accelerated Degradation Processes through Information Fusion [J]. Sensors, 2016, 16(8): 1242.