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An Intelligent Defect Detection Approach Based on Cascade Attention Network Under Complex Magnetic Flux Leakage Signals
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Journal:IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS

First Author:Jinhai Liu*(博导); Xiangkai Shen; Jianfeng Wang; Lin Jiang; Huaguang Zhang

Indexed by:Journal paper

Document Type:J

Volume:70

Issue:7

Translation or Not:no

Date of Publication:2023-02-17

Included Journals:SCI

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Date of Employment:2025-01-16

School/Department:自动化科学与电气工程学院

Education Level:博士研究生

Business Address:北京市海淀区学院路37号北京航空航天大学新主楼E1024

Gender:Male

Degree:Doctoral Degree in Engineering

Status:Employed

Alma Mater:东北大学

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