北京航空航天大学主页平台系统李秋英--中文主页-- Mao C, Li Q. A Testing-Coverage Software Reliability Growth Model Considering the Randomness of the Field Environment, IEEE International Conference on Software Quality, Reliability and Security Companion. IEEE, 2016:402-403.

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Mao C, Li Q. A Testing-Coverage Software Reliability Growth Model Considering the Randomness of the Field Environment, IEEE International Conference on Software Quality, Reliability and Security Companion. IEEE, 2016:402-403.

发布时间：2020-10-15点击次数：

论文类型：基础研究

文献类型：会议录

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CN号： null

收录刊物： EI

上一条：Tong H N, Li Q Y. Highly Reliable Software Reliability Assessment Based on Statistics of Extremes and Bootstrapping Method. Applied Mechanics & Materials, 2014, 670-671:1477-1481. 下一条：Li Q Y, Zhang H Q. The Preprocessing Method for Software Reliability Failure Data. Advanced Materials Research, 2013, 634-638:3998-4003.