Paper
Strain measurement at up to 3000 °C based on Ultraviolet-Digital Image Correlation
Release time:2024-06-01 Hits:Journal:NDT&E International
Key Words:Ultraviolet-Digital Image Correlation (UV-DIC); Speckle pattern; Single UV bandpass filter; High-temperature measurement
Indexed by:Journal paper
Translation or Not:no
Included Journals:SCI