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上一条: Yanyu Zhao, Yufu Qu. Extended depth of field for visual measurement systems with depth-invariant magnification. SPIE Optical Metrology and Inspection for Industrial Applications II, 2012, (8563):1~8
下一条: Yufu Qu, Wai Khoo, Edgardo Molina and Zhigang Zhu. Multimodal 3D Panoramic Imaging Using a Precise Rotating Platform. IEEE/ASME International Conference on Advanced Intelligent Mechatronics 2010, 260~265